Agilent/安捷伦半导体B1500A
B1500A Semiconductor Device Analyzer
Key Features & Specifications
General features
PC-based instrument with Microsoft Windows OS and EasyEXPERT software
Single-box solution for current-voltage (IV), capacitance-voltage (CV), pulse generation, fast IV, and time-domain measurement.
Ten module slots for source monitor units (SMUs) and other module types (MFCMU, HV-SPGU and WGFMU)
=====================================
专业回收、销售、租赁、维修各类二手电子测量仪器！
刘'S：（手机/）
张'R: （手机/）
Q Q:
=====================================
公司长期回收各类电子仪器仪表，如有闲置，
待处理的仪器，欢迎随时来电咨询！
诚信第一，质量为本，服务至诚!
您的满意是我的追求!
给我一个机会，我会还你一个惊喜!
承诺力求更可靠,服务力求更优质!
=========================================
Offline data analysis and application test development via Desktop EasyEXPERT software
Measurement capabilities
Supports current-voltage (IV) measurement to 0.1fA and 0.5μV
Supports both quasi-static and medium-frequency capacitance-voltage (CV) measurement
Supports accurate fast IV and time-domain measurement for a wide range of applications such as pulsed IV, NBTI and RTS noise (RTN) measurement.
Supports high voltage pulse generation (up to ±40 V) for high power and memory device testing.
Description
Summary
The Agilent B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements and also fast high-voltage pulsing. Its familiar, Microsoft Windows user interface supports Agilent’s EasyEXPERT software, which provides a new, more intuitive task-oriented approach to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Agilent B1500A can be used for a wide range of semiconductor device characterization needs (IC-CAP supports the B1500A). It is also an excellent solution for non-volatile memory cell characterization and high-speed device characterization (including advanced NBTI and RTS noise (RTN) measurement).
